Monday, July 7, 2008

FEI Rolls New Devices

Hillsboro, Oregon-based FEI Company has launched a new line of scanning electron microscopes, the firm announced this morning. According to FEI, its new extreme high resolution scanning electron microscopes (XHR SEMs) that offer improved resolutions of below one nanometer. The firm claimed that the new products allow sub-nanometer resolution from non-experts and without limitations on samples inherent in other systems. The firm's microscopes are used for scientific research and R&D, an in particular for semiconductor manufacturing processes. FEI said it plans to begin shipping the product in September.